National Institute of Advanced Industrial Science and Technology (AIST) This page is a page of the former research institute. We stopped updating on March 31.2001.
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Department of Materials Physics

Material Metrology Section

TEL:+81-727-51-9535
FAX:+81-727-51-9631
E-mail:metrol@onri.go.jp
Last update: December 10, 1997

The Profile of the Section

We are now developping new material fabrication techniques which can control compositions and structures of materials from micro to macro size regions more precisely, as well as relating such fabrication techniques to evaluation techniques and numerically designings.

Research Projects
  1. Advanced study on vapor phase deposition
    (Special Research) [FY1996-1999]
  2. Optical method for characterizing thin films using surface plasmon
    (Ordinary Research)[FY1996-1998]
  3. Research and development of ultra-high-quality transparent conductive films fabrication
    (Designated R&D) [FY1997-1999]


Staffs of Section


nameresearch area of interestE-mail address
Yoshiyuki Sato
(Head)
  • Preparation of oxide thin films and evaluation of those films
sato@onri.go.jp
Toshimitsu Tanaka
  • Evaluation of mechanical properties of industrial materials
toshit@onri.go.jp
Masato Kiuchi
  • Thin films processing using ion beams and computational study
dd160@onri.go.jp
Isao Nagai
  • Evaluation of mechanical properties of industrial materials
nagai@onri.go.jp
Kensuke Murai
  • Material evaluation and fabrication technologies using optical methods
murai@onri.go.jp


Recent publication of research



Others



Please send questions / comments to metrol@onri.go.jp .

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by M.Taniguchi, Osaka Natl. Res. Inst.