National Institute of Advanced Industrial Science and Technology (AIST) This page is a page of the former research institute. We stopped updating on March 31.2001.
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New Material Technology Laboratry


The New Material Technology Laboratory, with its facilities available to all the departments of the institute, contributes to the further promotion of various researchs on material development carried out in the institute, and also plays the role as a center for exchanging of information on the results of research achieved in and out of the institute.

A designated equipment management system is enforced in-house for the effective utilization of the large-size general-purpose equipment featuring high precision, shared by all the researchers in the institute. In order to maintain and utilize these designated pieces of equipment, the system contributes to the establishment of advanced metrological technology and materials evaluation technology. The host computer, one of these designated pieces of equipment, is connected on-line with its counterpart in the Research Information Processing System (TACC) installed for shared use at Tsukuba Research Center of Agency of Industrial Science and Technology, for the effective utilization for information retrieval, high-speed scientific computation, etc.

The designated pieces of equipment installed in the laboratory are shown in the table below. In addition, a state-of-the-art positive ion implantation system (6 Mev max.), negative ion implantation system, Bandegraph accelerator and a low-pressure spraying system are installed there.

Besides, a shared laboratory facility is provided to promote joint research projects undertaken in and out side the Institute.



Head of center

Dr.Teruo KODAMA
Dr.Hiroshi YAMASHITA
Mr.Yoshiyuki SATOH
Mr.Masashi HAYASHI



List of the Dedignated Pieces of Equipment
Super computerNuclear magnetic resonance analyzer for use with solid substances
Transmission electron microscope Nuclear magnetic resonance analyzer for use with solid substances
Scanning electron microscopePico-second laser system
Scanning probe microscope Time-resolved fluorescence spectrometer
Laser microscope Fourier-transform infrared spectroscope
X-ray fluorescence analyzer Raman scattering analizer
Extended X-ray absorption fine structure analyzer High-sensitivity gas-chromatograph mass spectrometer
Precision X-ray diffractometer Photoelectron spectrometer
Ultrasonic reflectoscope Dynamic micro-hardness tester
Oxygen/nitrogen analyzer Superconducting critical magnetic field/critical current measurement system


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by M.Taniguchi, Osaka Natl. Res. Inst.