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The New Material Technology Laboratory, with its facilities available to all the departments of the institute, contributes to the further promotion of various researchs on material development carried out in the institute, and also plays the role as a center for exchanging of information on the results of research achieved in and out of the institute.
A designated equipment management system is enforced in-house for the effective utilization of the large-size general-purpose equipment featuring high precision, shared by all the researchers in the institute. In order to maintain and utilize these designated pieces of equipment, the system contributes to the establishment of advanced metrological technology and materials evaluation technology. The host computer, one of these designated pieces of equipment, is connected on-line with its counterpart in the Research Information Processing System (TACC) installed for shared use at Tsukuba Research Center of Agency of Industrial Science and Technology, for the effective utilization for information retrieval, high-speed scientific computation, etc.
The designated pieces of equipment installed in the laboratory are shown in the table below. In addition, a state-of-the-art positive ion implantation system (6 Mev max.), negative ion implantation system, Bandegraph accelerator and a low-pressure spraying system are installed there.
Besides, a shared laboratory facility is provided to promote joint research projects undertaken in and out side the Institute.
|
Head of center Dr.Teruo KODAMA |
Dr.Hiroshi YAMASHITA |
|
Mr.Yoshiyuki SATOH | |
|
Mr.Masashi HAYASHI |
| List of the Dedignated Pieces of Equipment | |
|---|---|
| Super computer | Nuclear magnetic resonance analyzer for use with solid substances |
| Transmission electron microscope | Nuclear magnetic resonance analyzer for use with solid substances |
| Scanning electron microscope | Pico-second laser system |
| Scanning probe microscope | Time-resolved fluorescence spectrometer |
| Laser microscope | Fourier-transform infrared spectroscope |
| X-ray fluorescence analyzer | Raman scattering analizer |
| Extended X-ray absorption fine structure analyzer | High-sensitivity gas-chromatograph mass spectrometer |
| Precision X-ray diffractometer | Photoelectron spectrometer |
| Ultrasonic reflectoscope | Dynamic micro-hardness tester |
| Oxygen/nitrogen analyzer | Superconducting critical magnetic field/critical current measurement system |
by M.Taniguchi, Osaka Natl. Res. Inst.